The MinWidth of POLY layer represent the process technology.
See following example:
Continue reading “How to read ITF file to find the process technology”
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The MinWidth of POLY layer represent the process technology.
See following example:
Continue reading “How to read ITF file to find the process technology”
So today, "65 nm" or "45 nm" doesn’t exactly refer to the line width, and certainly doesn’t indicate how closely you can pack transistors together, although it does provide some indication of these things. Still, it is probably most accurate to say that the number is simply the name of the process, rather than the measure of any particular feature.
The standard design rules (max_transition, max_fanout, and max_capacitance) cannot account for all reliability issues in deep submicron technologies.A new design rule was introduced to model this behavior more accurately.
今天帮同事买了块华硕EN9600GT冰刃版的显卡,看到有个S/PDIF接口,感到很郁闷,为什么显卡会有音频接口呢。
后来查了一下,这是块支持HDTV的显卡,附有1个 DVI转HDMI转接头 和1 个 HDTV输出信号线,需要将音频输出到电视机的话就要链接S/PDIF。
Continue reading “显卡上的S/PDIF接口”
Timing Arc Definition:
Timing arcs, along with netlist interconnect information, are the paths followed by the path tracer during path analysis.
Each timing arc has a startpoint and an endpoint.
Continue reading “Timing Arc”
A cell degradation design rule specifies the maximum capacitive load a cell can drive without causing cell performance degradation during the fall transition.
But I don’t know the difference between cell degradation and max capacitance constraint rule:(
Virtual clock feature:
Ideal Network Feature: