Failure In Time (FIT) method of specifying component reliability.
The FIT rate is defined as the expected number of component failures per 10^9 (ten to the ninth power, or 1,000,000,000) hours.
Category: ASIC
ICOVL Cell
In Chip Overlay Cell，简称ICOVL单元，用于大的芯片设计中，检测工艺PO和OD（即栅）以及CO和PO（孔栅间距，或者栅的孔）的mask之间的重叠关系，可以减少mask对准上的错误。